Semiconductor integrated circuit having silicided elements of short length

ABSTRACT

A surface of a conductive member such as a gate electrode provided with a silicon layer is roughened. The roughened silicon layer is silicified so that its width is substantially increased, whereby phase transition of the silicide layer is simplified. Thus, the resistance of the refined silicide layer is reduced due to the simplified phase transition.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a silicide layer forming methodemployed for a semiconductor integrated circuit which is obtained byforming a number of electronic components on a substrate or the like anda semiconductor integrated circuit including a silicide layer, and moreparticularly, it relates to a silicide layer forming method by asalicide process employing a refractory metal silicide film for enablinga high-speed operation and attaining high reliability.

2. Description of the Background Art

An example of a general salicide (self-aligned silicide) process forforming a refractory silicide film is described with reference to FIGS.22 to 25.

First, a well 1a, isolation oxide films 2, and an impurity layer 3 whichcontrols a threshold voltage are formed on a silicon substrate 1.Thereafter a silicon oxide film 4 of 6.5 nm in thickness, for example,is formed on the silicon substrate 1, and a polycrystalline siliconlayer for defining a gate electrode is deposited on the oxide film 4 ina thickness of 200 nm. An impurity is added to this polycrystallinesilicon layer, which in turn is patterned by a photolithographic stepand thereafter anisotropically etched for forming a gate electrode 5.

Then, LDD (lightly doped drain) layers 6 which are also referred to asextension layers are formed, and thereafter an oxide film is depositedby CVD (chemical vapor deposition). This oxide film is etched back byreactive ion etching (hereinafter referred to as RIE), for forming sidewalls 7 consisting of silicon oxide on right and left sides of the gateelectrode 5.

Then, high-concentration source/drain layers 8 are formed byhigh-concentration ion implantation, and thereafter heat treatment isperformed for activation. FIG. 22 is a sectional view showing a stateafter completion of the activation.

Then, the salicide process is carried out.

In the salicide process, a surface of the silicon substrate 1 is firstcleaned by proper pretreatment, and thereafter a metal film 9 isdeposited on the structure shown in FIG. 22 (see FIG. 23).

Then, the silicon substrate 1 shown in FIG. 23 is heated under a properatmosphere for forming silicide films 10 by the silicon substrate 1 andthe polycrystalline silicon forming the gate electrode 5 (see FIG. 24).The composition of these silicide films 10 is expressed as MSix,assuming that M represents a metal element forming the metal film 9, forexample, where x represents the ratio of silicon to the metal. In thiscase, short-time heat treatment (rapid thermal annealing) is generallyperformed through a lamp annealing furnace. The heat treatment which isperformed through the lamp annealing furnace immediately afterdeposition of the metal film 9 is hereafter referred to as first RTA.

At this time, no silicide reaction takes place on upper portions of theisolation oxide films 2 and the side walls 7 due to absence of silicon,and the unreacted metal film 9 remains at least on these upper portions(see FIG. 24). Then, the metal film 9 still containing the unreactedmetal M etc. is selectively removed while leaving the silicide films 10formed by the reacted silicide MSix (see FIG. 25). Basically, thesalicide process is ended in the aforementioned step.

However, when the silicide films formed through the aforementionedprocess are made of titanium silicide TiSix, for example, further heattreatment is performed at a high temperature or over a long time forforming titanium silicide films of TiSi₂ having a different compositionor crystal structure, since the electric properties of titanium silicide(TiSix) are insufficient. Also in case of changing the composition orcrystal structure of titanium silicide, short-time heat treatment isgenerally performed through a lamp annealing furnace. The short-timeheat treatment employed for changing the composition or crystalstructure of such silicide films is hereinafter referred to as secondRTA. Due to the salicide process employing the aforementioned steps, anelectrode can advantageously be selectively formed only on a regionexposing a silicon surface on the silicon substrate 1.

In recent years, on the other hand, integrated circuits are implementedwith higher density of integration such that the gate length or asilicide wire of a planar MOS transistor which is a kind of MIStransistor is refined, for example. Due to the aforementioned structureof the conventional MIS transistor fabricated through the salicideprocess, further, phase transition from a C49 phase to a C54 phasehardly takes place in the crystal structure even by second RTA in caseof titanium silicide (TiSi₂) when the gate length or the width of thesilicide wire is refined to below 0.5 μm, leading to such a problem thatthe sheet resistance of the titanium silicide films is abruptlyincreased. FIG. 26 shows exemplary gate dependency of gate resistance intitanium silicide (TiSi₂).

SUMMARY OF THE INVENTION

According to a first aspect of the present invention, a silicide layerforming method includes a step of forming a conductor member which isprovided on its surface with a silicon layer of a predetermined width, aroughening step of roughening the silicon layer, and a step ofsilicifying the silicon layer thereby forming a silicide layer, and thepredetermined width is narrower than a width hardly causing phasetransition of the silicide layer when the silicon layer is flat.

According to a second aspect of the present invention, the rougheningstep has a step of roughening the silicon layer with a substantiallysemispherical projection, and the predetermined width is up to (2/π)times the width hardly causing the phase transition.

According to a third aspect of the present invention, the step ofsilicifying the silicon layer has a step of silicifying the siliconlayer with titanium, and the width hardly causing the phase transitionis 0.5 μm.

According to a fourth aspect of the present invention, the diameter ofthe semispherical projection is larger than 0.05 μm.

According to a fifth aspect of the present invention, the semisphericalprojection has a radius smaller than (2/π) times the width hardlycausing the phase transition of the silicide layer.

According to a sixth aspect of the present invention, the rougheningstep has a step of roughening the silicon layer with hot phosphoricacid.

According to a seventh aspect of the present invention, side walls whichare L-shaped in section are formed on both sides of the conductormember.

According to an eighth aspect of the present invention, the silicidelayer forming method further includes a step of forming side walls whichare higher than the conductor member on both sides of the conductormember.

The present invention is also directed to a semiconductor integratedcircuit. According to a ninth aspect of the present invention, asemiconductor integrated circuit comprises an insulating film, and aconductor member which is provided on the insulating film and insulatedby the insulating film for supplying an electric charge, and side wallsbeing provided on said insulating film and holding said conductormember, while the conductor member includes a silicide layer which isprovided on its surface with a number of undulations and the conductormember held between the side walls has only a width which is not morethan a width hardly causing phase transition of silicide when thesilicide layer is flatly formed.

In the silicide layer forming method according to the first aspect ofthe present invention, the width of the silicide layer can besubstantially increased to that readily causing phase transition,whereby the sheet resistance of the silicide layer can be reduced and asemiconductor integrated circuit which is suitable for miniaturizationcan be effectively obtained.

In the silicide layer forming method according to the second aspect ofthe present invention, the resistance value of the silicide layer can bereadily reduced to the width 2/π times that hardly causing phasetransition by forming the semispherical projection.

In the silicide layer forming method according to the third aspect ofthe present invention, it is possible to form a titanium silicide layerof about 0.3 to 0.5 μm in width whose resistance value is reduced byphase transition to a C54 phase on a semiconductor integrated circuit,whereby a semiconductor integrated circuit which is suitable forminiaturization can be effectively obtained.

In the silicide layer forming method according to the fourth aspect ofthe present invention, the resistance value of the titanium silicidelayer can be reduced by sufficiently causing phase transition, whereby asemiconductor integrated circuit which is suitable for miniaturizationcan be effectively obtained.

In the silicide layer forming method according to the fifth aspect ofthe present invention, the projection can be formed in the ratio of atleast one along the width of the silicide layer, whereby dispersion ofthe resistance value can be reduced and a semiconductor integratedcircuit which is suitable for mass production can be effectivelyobtained.

In the silicide layer forming method according to the sixth aspect ofthe present invention, the width of the silicide layer can be simplyincreased to that substantially readily causing phase transition due tothe roughening with hot phosphoric acid and the sheet resistance of thesilicide layer can be reduced, whereby a semiconductor integratedcircuit which is suitable for miniaturization can be effectivelyobtained.

In the silicide layer forming method according to the seventh aspect ofthe present invention, the distance between a gate electrode and asource/drain layer can be increased along surfaces of the side walls byrendering the side walls L-shaped in section, whereby the yield of thesemiconductor integrated circuit can be effectively improved by reducingoccurrence of short-circuiting across the gate electrode and thesource/drain layer.

In the silicide layer forming method according to the eighth aspect ofthe present invention, the distance between the gate electrode and thesource/drain layer can be increased along the surfaces of the side wallsby rendering the side walls higher than the gate electrode, whereby theyield of the semiconductor integrated circuit can be effectivelyimproved by reducing occurrence of short-circuiting across the gateelectrode and the source/drain layer.

In the semiconductor integrated circuit according to the ninth aspect ofthe present invention, the resistance value of the silicide layer can besuppressed with a width smaller than that hardly causing phasetransition of silicide due to the projections/depressions formed on thesurface of the silicide layer and the conductor member forming thesemiconductor integrated circuit can be refined, whereby miniaturizationcan be effectively attained.

An object of the present invention is to improve the degree ofintegration of a semiconductor integrated circuit by providing atechnique of avoiding short-circuiting across a gate electrode and asource/drain layer in formation of a silicide layer, or by providing atechnique of obtaining a silicide film whose sheet resistance is notincreased even if the width of a silicified part such as an upperportion of a gate electrode or a source/drain layer is small.

The foregoing and other objects, features, aspects and advantages of thepresent invention will become more apparent from the following detaileddescription of the present invention when taken in conjunction with theaccompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 to FIG. 4 are sectional views for illustrating a first method offabricating a MOS transistor according to an embodiment 1 of the presentinvention;

FIGS. 5A and 5B are conceptual diagrams for illustrating shapes ofprojections/depressions formed on surfaces of silicon layersrespectively;

FIG. 6 and FIG. 7 are sectional views for illustrating a second methodof fabricating a MOS transistor according to the embodiment 1 of thepresent invention;

FIG. 8 is a sectional view for illustrating an exemplary silicide wireaccording to the embodiment 1 of the present invention;

FIG. 9 is a sectional view for illustrating another exemplary silicidewire according to the embodiment 1 of the present invention;

FIG. 10 to FIG. 13 are sectional views for illustrating a first methodof fabricating a MOS transistor according to an embodiment 2 of thepresent invention;

FIG. 14 and FIG. 15 are sectional views for illustrating a second methodof fabricating a MOS transistor according to the embodiment 2 of thepresent invention;

FIG. 16 to FIG. 19 are sectional views for illustrating a first methodof fabricating a MOS transistor according to an embodiment 3 of thepresent invention;

FIG. 20 and FIG. 21 are sectional views for illustrating a second methodof fabricating a MOS transistor according to the embodiment 3 of thepresent invention;

FIG. 22 to FIG. 25 are sectional views for illustrating an exemplaryconventional method of fabricating a MOS transistor;

FIG. 26 is a graph showing the relation between gate lengths and gateresistance in a gate electrode made of titanium silicide; and

FIG. 27 is a sectional view showing a part of FIG. 25 in an enlargedmanner.

DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiment 1

A method of fabricating a MOS transistor according to an embodiment 1 ofthe present invention and a MOS transistor formed by the same aredescribed with reference to FIGS. 1 to 4. FIGS. 1 to 4 are sectionalviews showing steps of fabricating a MOS transistor according to theembodiment 1 respectively. This MOS transistor is fabricated withapplication of a silicide layer forming method according to the presentinvention.

First, isolation oxide films 2, a well 1a and an impurity layer 3 forcontrolling a threshold voltage are formed on a silicon substrate 1 by aconventional method of fabricating a MOSFET. Then, a gate insulatingfilm 4 is deposited on the silicon substrate 1, and an amorphous siliconfilm 30 is deposited further thereon, as shown in FIG. 1. The amorphoussilicon film 30 is deposited at an evaporation temperature of about 520°C. under evaporation pressure of about 2 Torr, with silane (SiH₄) at aflow rate of 1300 sccm or disilane (Si₂ H₆) at a flow rate of 100 sccm.At this time, carrier gas of nitrogen (N₂), hydrogen (H₂) or helium (He)is fed by about 500 sccm, for example. However, the amorphous siliconfilm 30 can be formed without feeding such carrier gas.

Then, the amorphous silicon film 30 is patterned by a photolithographicprocess, and thereafter anisotropically etched for forming a gateelectrode 11. After formation of LDD layers 6, an insulating film isdeposited by CVD at a low temperature causing no crystal growth ofamorphous silicon forming the gate electrode 11. The insulating film isprepared from silicon oxide or silicon nitride, for example. Theinsulating film is etched back for forming side walls 7, as shown inFIG. 2.

Before or after high-concentration source/drain layers 8 are formedthrough the side walls 7 serving as masks, disilane (Si₂ H₆) is adsorbedon a surface of the gate electrode 11 which is made of amorphous siliconin a molecular state, and decomposed on this surface for forming nucleiof polycrystalline silicon. Then, the substrate temperature is increasedto about 600 to 700° C., for making crystal growth of amorphous siliconon the basis of the nuclei of polycrystalline silicon formed on the gateelectrode 11 consisting of amorphous silicon. Thus, amorphous silicon isconverted to polycrystalline silicon, as shown in FIG. 3. Formed in thiscase is a gate electrode 5 consisting of polycrystalline silicon, whichis roughened by a number of semispherical projections 12. Silicidelayers 20 are formed on surfaces of the gate electrode 5 and thesource/drain layers 8 respectively, as shown in FIG. 4. The diameters ofthe projections 12 are preferably at least 0.05 μm for sufficientlyattaining an effect of simplifying phase transition, in case of formingtitanium silicide (TiSi₂) layers of 0.03 to 0.1 μm in thickness. If thephysical gate length is 0.3 to 0.5 μm, the diameter of each projection12 is preferably rendered not more than about 0.3 μm, in order toprovide one or more projections 12 for suppressing dispersion of a localeffective gate length.

A projection of 0.05 to 0.3 μm in diameter means a semisphericalpolycrystalline silicon grain of 0.05 to 0.3 μm in height, which can bemeasured by observation with a scanning microscope in general.Roughening treatment is described in "Growth Mechanism of Si Films withHemispherical Grains" by Toru Tatsumi, Akira Sakai, Taeko Ikarashi andHirohito Watanabe, Applied Physics, Vol. 61, No. 11, pp. 1147 to 1151(1992), for example.

FIG. 5(a) is adapted to illustrate the relation between the radius R1 ofeach projection and the gate length L1. When such projections having theradius R1 are transversely aligned with each other, L1/R1 projectionsare formed along the gate length direction. The current surface lengthis expressed as (π/2)×R1×2×(L1/R1×2), which is a function depending onlyon the gate length L1 regardless of the radius R1. Thus, it comes tothat the width of the silicide layers 20 is about 1.6 times the gatelength.

Due to the aforementioned fabrication steps, it is possible to preventoccurrence of such a phenomenon that phase transition from a C49 phaseto a C54 phase is difficult and the gate resistance is increased whenthe gate length is set in the range of 0.3 to 0.5 μm in case of forminga titanium silicide (TiSi₂) layer on the gate electrode 5, for example.Even if the gate electrode 5 is refined to about 0.3 to 0.5 μm,therefore, increase of the resistance value can be suppressed byroughening, and the MOS transistor can operate at a higher speed ascompared with the prior art.

While silicification of the gate electrode 5 of the MOS transistor hasbeen described with reference to the embodiment 1, a similar process isapplicable to a silicide wire. Also in this case, the resistance of thesilicide wire can be reduced by roughening an upper part of an amorphoussilicon film. Namely, the technique described with reference to theembodiment 1 is employable in case of forming a silicide layer on a fineregion such as a semiconductor integrated circuit. This also applies tothe following embodiments in common.

While the amorphous silicon film is roughened after formation of theside walls 7 in the aforementioned embodiment 1, the surface of the gateelectrode 5 consisting of amorphous silicon may alternatively beroughened by forming a number of projections on the silicon surfacebefore forming the side walls 7. FIG. 6 shows a sectional shape of aroughened gate electrode 5 consisting of polycrystalline silicon in suchcase.

If the surface of the gate electrode 5 is roughened in such a manner,there is a possibility of increasing frequency in occurrence ofshort-circuiting across the gate electrode 5 and source/drain layers 8from side surfaces of the gate electrode 5 through side walls 7 due tonuclei of polycrystalline silicon formed on a silicon substrate 1.However, the silicon substrate 1 consisting of single-crystallinesilicon is not roughened despite the nuclei of polycrystalline silicon,whereby increase of the frequency in short-circuiting can be preventedby slightly performing anisotropic or isotropic etching after rougheningof amorphous silicon thereby removing the nuclei of polycrystallinesilicon from the silicon substrate 1. FIG. 6 shows a sectional shape ofthe silicon substrate 1 which is obtained when a salicide process iscarried out after formation of the side walls 7 for forming silicidelayers 20 on surfaces of the gate electrode 5 and the source/drainlayers 8 respectively. FIG. 7 shows the silicide layers 20 formed byapplying a salicide process to the silicon substrate 1 shown in FIG. 6.

While the embodiment 1 has been described with reference to rougheningof the gate electrode surface, the present invention is applicable toany silicide film of 0.5 μm in width such as a silicide wire 16 having aline width of 0.3 to 0.5 μm which is formed on an insulating film 15shown in FIG. 8, for example, for attaining an effect similar to that ofthe embodiment 1. FIG. 9 is a sectional view showing side walls 7 whichcan be formed after roughening the silicide wire 16.

A polycrystalline silicon surface can alternatively be roughened withhot phosphoric acid. Such hot phosphoric acid (H₃ PO₄) is used in aconcentration of 70 to 90% at a temperature of 130 to 160° C. Silicon isnot further corroded when dissolved in hot phosphoric acid up to itssaturation concentration, projections formed in this case are notsemispherical as shown in FIG. 5(a), but projections/depressions areformed in shapes shown in FIG. 5(b). In this case, the substantial widthof the silicide layer is increased as the height h1 of theprojections/depressions is increased, the cycle L2 is reduced and thenumber of repetition times is increased. FIGS. 5(a) and 5(b) areconceptual diagrams employed for facilitating easy understanding of thedescription, and the projections/depressions are not so symmetrical inpractice. When the polycrystalline silicon surface is doped with animpurity and roughened with hot phosphoric acid, theprojections/depressions can be increased in size. Theprojections/depressions can be readily formed with no requirement forcontrol of a corrosion time etc., since silicon dissolved in hotphosphoric acid up to its saturation concentration is not furthercorroded.

The width (gate length) hardly causing phase transition is defined by apoint of intersection between an extension line of a portion hardlychanging the resistance value of silicide and that formed by linearlyapproximating a portion increasing the resistance value to 1.5 times totwice in the graph shown in FIG. 26. These extension lines are shown indotted lines in FIG. 26.

It may be possible to reduce the width hardly causing phase transitionbelow 0.5 μm in case of converting the silicon surface by ionimplantation before deposition of titanium, or by sputtering titanium ata high temperature.

Embodiment 2

A method of fabricating a MOS transistor according to an embodiment 2 ofthe present invention and a MOS transistor formed by the same aredescribed with reference to FIGS. 10 to 13. FIGS. 10 to 13 are sectionalviews showing steps of fabricating a MOS transistor according to theembodiment 2 of the present invention. This MOS transistor is fabricatedby application of the inventive silicide layer forming method.

First, a silicon substrate 1 provided with an amorphous silicon film 30is prepared as shown in FIG. 1, similarly to the embodiment 1.

Then, disilane (Si₂ H₆) is adsorbed on a surface of the amorphoussilicon film 30 in a molecular state, and decomposed on this surface forforming nuclei of polycrystalline silicon. Then, the substratetemperature is increased to about 600 to 700° C. for making crystalgrowth of amorphous silicon on the basis of the nuclei ofpolycrystalline silicon formed on the amorphous silicon film 30, therebyconverting amorphous silicon to polycrystalline silicon, as shown inFIG. 10. Thus formed is a polycrystalline silicon film 31 which isroughened by a number of semispherical projections 30. The diameters ofthe projections 32 are in a preferable range, similarly to theprojections 12.

Then, the polycrystalline silicon film 31 is patterned for forming agate electrode 5. This gate electrode 5 is employed as a mask forforming LDD layers 6, and thereafter a silicon oxide film 33 isdeposited by CVD as a first insulating film of about 150 to 500 Å, forexample, and a silicon nitride film 34 is deposited by CVD as a secondinsulating film of about 300 to 1000 Å, for example. These first andsecond insulating films are etched back, whereby a state shown in FIG.11 can be attained.

Then, the silicon nitride film 34 is isotropically etched with hotphosphoric acid hardly corroding polycrystalline silicon and siliconoxide while readily corroding silicon nitride respectively. Due to thisisotropic etching, the silicon nitride film 34 is removed for formingside walls 36 having L-shaped sections, as shown in FIG. 12.

A salicide process is applied to the silicon substrate 1 shown in FIG.12, for forming silicide layers 37 on surfaces of the gate electrode 5and high-concentration source/drain layers 8 respectively (see FIG. 13).At this time, the distances between an upper portion of the gateelectrode 5 and the source/drain layers 8 are substantially increasedalong the side walls 36 due to the side walls 36 having L-shapedsections, whereby the gate electrode 5 and the source/drain layers 8 canbe prevented from short-circuiting caused by silicide growing andcreeping along the surfaces of the side walls 36. In general, a silicidelayer 10 growing along a side surface of a side wall 7 may causeshort-circuiting across a gate electrode 5 and a source/drain layer 8 asshown in FIG. 27, for example. When the gate electrode 5 is roughened,the possibility of short-circuiting across the gate electrode 5 and thesource/drain layers 8 may be increased due to the roughening. Therefore,it is particularly effective to form the side walls 36 in L-shapedsections.

The silicide layer 37 formed on the gate electrode 5 in theaforementioned manner in accordance with the embodiment 2 has low sheetresistance, similarly to the silicide layer 20 formed on the surface ofthe gate electrode 5 in accordance with the embodiment 1.

While the amorphous silicon film 30 is roughened before patterned forforming the gate electrode 5 in the embodiment 2, the surface of thegate electrode 5 consisting of amorphous silicon may alternatively beroughened by forming a number of projections on the silicon surfaceafter forming the gate electrode 5 and before forming the side walls 7.FIG. 14 shows a sectional shape of a roughened gate electrode consistingof polycrystalline silicon. FIG. 15 shows silicide layers 37 formed byapplying a salicide process to a silicon substrate 1 shown in FIG. 14.

The fabrication method according to the embodiment 2 can also be appliedto a silicide wire similarly to the embodiment 1, for attaining asimilar effect on the silicide wire which is refined similarly to thegate electrode.

Embodiment 3

A method of fabricating a MOS transistor according to an embodiment 3 ofthe present invention and a MOS transistor formed by the same aredescribed with reference to FIGS. 16 to 19. FIGS. 16 to 19 are sectionalviews showing steps of fabricating a MOS transistor according to theembodiment 3 of the present invention. This MOS transistor is fabricatedby application of the inventive silicide layer forming method.

First, a silicon substrate 1 is so prepared that a polycrystallinesilicon film 31 provided with a number of projections 32 shown in FIG.10 is deposited thereon, similarly to the fabrication method accordingto the embodiment 2.

Then, a stacked film is deposited on the polycrystalline silicon film 31by about 500 Åm, for example. The stacked film is prepared from siliconnitride, for example. A resist film is patterned by a photolithographicstep, thereafter the stacked film is anisotropically etched, and theetched stacked film is employed as a mask for anisotropically etchingthe polycrystalline silicon film 31, thereby forming a gate electrode 5.At this time, a cap layer 40 having projections/depressions is formed onthe gate electrode 5, as shown in FIG. 16.

After formation of LDD layers 6, a silicon oxide film is deposited byCVD as an insulating film of about 600 to 1500 Å for forming side walls,for example. The silicon oxide film is etched back by RIE, for formingside walls 41, as shown in FIG. 17. At this time, etching conditions areso set that the cap layer 40 made of silicon nitride remains after thesilicon oxide film is etched back.

Then, the silicon nitride film is etched with hot phosphoric acid hardlycorroding polycrystalline silicon and silicon oxide respectively, forremoving the cap layer 40. The side walls 41 formed in theaforementioned manner are higher than the gate electrode 5 (see FIG.18).

Then, high-concentration source/drain layers 8 are formed. Thereaftersilicide layers 45 are formed on surfaces of the gate electrode 5 andthe high-concentration source/drain layers 8 respectively through asalicide process similarly to the prior art, as shown in FIG. 19.

The MOS transistor fabricated in the aforementioned manner has the highside walls 41, whereby the distances between the side walls 41 which areelectrically connected with the gate electrode 5 and thehigh-concentration source/drain layers 8 are increased in thefabrication steps as compared with side walls of general height. Thus,it is possible to suppress occurrence of short-circuiting across thegate electrode 5 and the source/drain layers 8 caused by silicidecreeping along the surfaces of the side walls 41. When the gateelectrode 5 is roughened, the possibility of short-circuiting across thegate electrode 5 and the source/drain layers 8 may be increased due tothe roughening. Therefore, it is particularly effective to increase theheight of the side walls 41.

The sheet resistance of the gate electrode 5 can be reduced by thesilicide layer 42, similarly to the embodiments 1 and 2.

While the cap layer 40 is made of silicon nitride in the aforementionedembodiment, the cap layer 40 may be prepared from any material so far asthe same can be etched with sufficient selectivity for the side walls 41and the gate electrode 5.

While the amorphous silicon film 30 is roughened before patterned forforming the gate electrode 5 in the embodiment 3, the surface of thegate electrode 5 consisting of amorphous silicon may alternatively beroughened by forming a number of projections on the silicon surfaceafter forming the gate electrode 5 and before forming the side walls 7.FIG. 20 shows a sectional shape of a roughened gate electrode consistingof polycrystalline silicon. FIG. 21 shows silicide layers 37 formed byapplying a salicide process to a silicon substrate 1 shown in FIG. 20.

The fabrication method according to the embodiment 3 can be applied to asilicide wire similarly to the embodiment 1, to attain a similar effecton the silicide wire which is refined similarly to the gate electrode.

While the conductor member is prepared from silicon in each of theaforementioned embodiments, a silicon layer may be formed on a partialsurface of the conductor member, to attain an effect similar to those ofthe aforementioned embodiments.

While the invention has been shown and described in detail, theforegoing description is in all aspects illustrative and notrestrictive. It is therefore understood that numerous modifications andvariations can be devised without departing from the scope of theinvention.

We claim:
 1. A semiconductor integrated circuit comprising:an insulatingfilm; a conductive member being provided on said insulating film andinsulated by said insulating film for supplying an electric charge; andside walls being provided on said insulating film and holding saidconductive member, said conductive member including a silicide layerbeing provided on its surface with a number of undulations havingsemispherical projections, said conductive member, being held betweensaid side walls, having only a width being not more than (2/π) times awidth hardly causing phase transition of silicide when said silicidelayer is flatly formed, said semispherical projections having a radiussmaller than (2/π) times said width hardly causing the phase transition.2. The semiconductor integrated circuit in accordance with claim 1,wherein said silicide layer includes titanium silicide and a width ofthe silicide layer is not more than 0.5 μm.
 3. The semiconductorintegrated circuit in accordance with claim 2, wherein the width of saidsilicide layer is larger than 1/π μm.